Optical impedance matching with scanning near-field optical microscopy
نویسندگان
چکیده
منابع مشابه
Scanning near-field optical microscopy.
An average human eye can see details down to 0,07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today's science needs eyes for the nano-world. Examples are easily found in biology and medical sciences. There is a great need to determine shape, size, chemical composition, molecular structure and...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملPicosecond multiphoton scanning near-field optical microscopy.
We have implemented simultaneous picosecond pulsed two- and three-photon excitation of near-UV and visible absorbing fluorophores in a scanning near-field optical microscope (SNOM). The 1064-nm emission from a pulsed Nd:YVO4 laser was used to excite the visible mitochondrial specific dye MitoTracker Orange CM-H2TMRos or a Cy3-labeled antibody by two-photon excitation, and the UV absorbing DNA d...
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ژورنال
عنوان ژورنال: Journal of Physics D: Applied Physics
سال: 2003
ISSN: 0022-3727,1361-6463
DOI: 10.1088/0022-3727/36/18/003